Information card for entry 7016144
| Formula |
C24 H38 N10 Ni2 O6 S4 |
| Calculated formula |
C24 H38 N10 Ni2 O6 S4 |
| SMILES |
C12=C(C(=O)N3CC[NH2][Ni]43N(C1=O)CC[NH2]4)SC(=C1SC3=C(C(=O)N4CC[NH2][Ni]54N(C3=O)CC[NH2]5)S1)S2.N(C=O)(C)C.N(C=O)(C)C |
| Title of publication |
Bis(diamino-diamido)-tetrathiafulvalene, a redox active sensor for proton, anions, and cations. |
| Authors of publication |
Shi, Zheng; Han, Qiong-Hua; Li, Xin-Yu; Shao, Ming-Yan; Zhu, Qin-Yu; Dai, Jie |
| Journal of publication |
Dalton transactions (Cambridge, England : 2003) |
| Year of publication |
2011 |
| Journal volume |
40 |
| Journal issue |
28 |
| Pages of publication |
7340 - 7347 |
| a |
8.3195 ± 0.0009 Å |
| b |
13.0986 ± 0.0014 Å |
| c |
15.951 ± 0.002 Å |
| α |
90° |
| β |
105.181 ± 0.003° |
| γ |
90° |
| Cell volume |
1677.6 ± 0.3 Å3 |
| Cell temperature |
223 ± 2 K |
| Ambient diffraction temperature |
223 ± 2 K |
| Number of distinct elements |
6 |
| Space group number |
14 |
| Hermann-Mauguin space group symbol |
P 1 21/c 1 |
| Hall space group symbol |
-P 2ybc |
| Residual factor for all reflections |
0.1035 |
| Residual factor for significantly intense reflections |
0.072 |
| Weighted residual factors for significantly intense reflections |
0.12 |
| Weighted residual factors for all reflections included in the refinement |
0.1309 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.047 |
| Diffraction radiation wavelength |
0.71075 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
No |
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https://www.crystallography.net/7016144.html