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Information card for entry 7016144
Preview
Coordinates | 7016144.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C24 H38 N10 Ni2 O6 S4 |
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Calculated formula | C24 H38 N10 Ni2 O6 S4 |
SMILES | C12=C(C(=O)N3CC[NH2][Ni]43N(C1=O)CC[NH2]4)SC(=C1SC3=C(C(=O)N4CC[NH2][Ni]54N(C3=O)CC[NH2]5)S1)S2.N(C=O)(C)C.N(C=O)(C)C |
Title of publication | Bis(diamino-diamido)-tetrathiafulvalene, a redox active sensor for proton, anions, and cations. |
Authors of publication | Shi, Zheng; Han, Qiong-Hua; Li, Xin-Yu; Shao, Ming-Yan; Zhu, Qin-Yu; Dai, Jie |
Journal of publication | Dalton transactions (Cambridge, England : 2003) |
Year of publication | 2011 |
Journal volume | 40 |
Journal issue | 28 |
Pages of publication | 7340 - 7347 |
a | 8.3195 ± 0.0009 Å |
b | 13.0986 ± 0.0014 Å |
c | 15.951 ± 0.002 Å |
α | 90° |
β | 105.181 ± 0.003° |
γ | 90° |
Cell volume | 1677.6 ± 0.3 Å3 |
Cell temperature | 223 ± 2 K |
Ambient diffraction temperature | 223 ± 2 K |
Number of distinct elements | 6 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/c 1 |
Hall space group symbol | -P 2ybc |
Residual factor for all reflections | 0.1035 |
Residual factor for significantly intense reflections | 0.072 |
Weighted residual factors for significantly intense reflections | 0.12 |
Weighted residual factors for all reflections included in the refinement | 0.1309 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.047 |
Diffraction radiation wavelength | 0.71075 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/7016144.html
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