Crystallography Open Database
- COD Home
- Accessing COD Data
- Add Your Data
- Documentation
Information card for entry 7016174
Preview
Coordinates | 7016174.cif |
---|---|
Original paper (by DOI) | HTML |
Common name | 1476 (Cu(SPN-iPr)2)PF6 at 100K |
---|---|
Formula | C22 H38 Cu F6 N4 P3 S2 |
Calculated formula | C22 H38 Cu F6 N4 P3 S2 |
SMILES | [Cu]12([S]=P(Nc3[n]1cccc3)(C(C)C)C(C)C)[S]=P(Nc1[n]2cccc1)(C(C)C)C(C)C.[P](F)(F)(F)(F)(F)[F-] |
Title of publication | Tri- and tetracoordinate copper(i) complexes bearing bidentate soft/hard SN and SeN ligands based on 2-aminopyridine. |
Authors of publication | Oztopcu, Ozgür; Mereiter, Kurt; Puchberger, Michael; Kirchner, Karl A. |
Journal of publication | Dalton transactions (Cambridge, England : 2003) |
Year of publication | 2011 |
Journal volume | 40 |
Journal issue | 26 |
Pages of publication | 7008 - 7021 |
a | 7.877 ± 0.0006 Å |
b | 13.3222 ± 0.001 Å |
c | 14.8577 ± 0.0011 Å |
α | 90° |
β | 101.953 ± 0.001° |
γ | 90° |
Cell volume | 1525.3 ± 0.2 Å3 |
Cell temperature | 100 ± 2 K |
Ambient diffraction temperature | 100 ± 2 K |
Number of distinct elements | 7 |
Space group number | 7 |
Hermann-Mauguin space group symbol | P 1 n 1 |
Hall space group symbol | P -2yac |
Residual factor for all reflections | 0.0421 |
Residual factor for significantly intense reflections | 0.0396 |
Weighted residual factors for significantly intense reflections | 0.102 |
Weighted residual factors for all reflections included in the refinement | 0.1049 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.055 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/7016174.html
All data in the COD and the database itself are dedicated to the
public domain and licensed under the
CC0
License
.
Users of the data should acknowledge the original authors of the
structural data.