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Information card for entry 7016419
Preview
Coordinates | 7016419.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C20 H16 Cu4 N4 Te4 |
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Calculated formula | C20 H16 Cu4 N4 Te4 |
SMILES | [Te]12[Cu]3456[Te]7[Cu]893([Te]3[Cu]%1059([Te]([Cu]148%10[n]1c3cccc1)c1cccc[n]61)[n]1ccccc71)[n]1c2cccc1 |
Title of publication | Copper(i) 2-pyridyl selenolates and tellurolates: Synthesis, structures and their utility as molecular precursors for the preparation of copper chalcogenide nanocrystals and thin films. |
Authors of publication | Sharma, Rakesh K.; Kedarnath, G.; Jain, Vimal K.; Wadawale, Amey; Pillai, C. G. S.; Nalliath, Manoj; Vishwanadh, B. |
Journal of publication | Dalton transactions (Cambridge, England : 2003) |
Year of publication | 2011 |
Journal volume | 40 |
Journal issue | 36 |
Pages of publication | 9194 - 9201 |
a | 10.343 ± 0.009 Å |
b | 11.707 ± 0.006 Å |
c | 12.276 ± 0.006 Å |
α | 104.91 ± 0.04° |
β | 109.42 ± 0.05° |
γ | 95.39 ± 0.04° |
Cell volume | 1328.1 ± 1.6 Å3 |
Cell temperature | 298 ± 2 K |
Ambient diffraction temperature | 298 ± 2 K |
Number of distinct elements | 5 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.2293 |
Residual factor for significantly intense reflections | 0.0602 |
Weighted residual factors for significantly intense reflections | 0.111 |
Weighted residual factors for all reflections included in the refinement | 0.1523 |
Goodness-of-fit parameter for all reflections included in the refinement | 0.942 |
Diffraction radiation wavelength | 0.71069 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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