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Information card for entry 7016571
Preview
Coordinates | 7016571.cif |
---|---|
Original paper (by DOI) | HTML |
Chemical name | {[(dippe)Ni(CO)]2(mu-dippe)} |
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Formula | C44 H96 Ni2 O2 P6 |
Calculated formula | C44 H96 Ni2 O2 P6 |
SMILES | CC(C)[P]1(C(C)C)CC[P]([Ni]1([P](C(C)C)(C(C)C)CC[P](C(C)C)(C(C)C)[Ni]1([P](C(C)C)(C(C)C)CC[P]1(C(C)C)C(C)C)C#[O])C#[O])(C(C)C)C(C)C |
Title of publication | Reduction of CO(2) and SO(2) with low valent nickel compounds under mild conditions. |
Authors of publication | González-Sebastián, Lucero; Flores-Alamo, Marcos; García, Juventino J |
Journal of publication | Dalton transactions (Cambridge, England : 2003) |
Year of publication | 2011 |
Journal volume | 40 |
Journal issue | 36 |
Pages of publication | 9116 - 9122 |
a | 8.722 ± 0.0006 Å |
b | 11.5158 ± 0.0008 Å |
c | 14.3744 ± 0.001 Å |
α | 102.32 ± 0.006° |
β | 91.092 ± 0.006° |
γ | 112.112 ± 0.007° |
Cell volume | 1298.88 ± 0.18 Å3 |
Cell temperature | 130 ± 2 K |
Ambient diffraction temperature | 130 ± 2 K |
Number of distinct elements | 5 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0499 |
Residual factor for significantly intense reflections | 0.0394 |
Weighted residual factors for significantly intense reflections | 0.0905 |
Weighted residual factors for all reflections included in the refinement | 0.0957 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.083 |
Diffraction radiation probe | x-ray |
Diffraction radiation wavelength | 1.5418 Å |
Diffraction radiation type | CuKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/7016571.html
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Users of the data should acknowledge the original authors of the
structural data.