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Information card for entry 7016836
Preview
Coordinates | 7016836.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C27 H60 In N9 |
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Calculated formula | C27 H60 In N9 |
SMILES | [In]123([N](C(C)C)=C(N1C(C)C)N(C)C)(N(C(C)C)C(=[N]2C(C)C)N(C)C)N(C(C)C)C(=[N]3C(C)C)N(C)C |
Title of publication | Chemical vapour deposition of In(2)O(3) thin films from a tris-guanidinate indium precursor. |
Authors of publication | Barry, Seán T; Gordon, Peter G.; Ward, Matthew J.; Heikkila, Mikko J.; Monillas, Wesley H.; Yap, Glenn P. A.; Ritala, Mikko; Leskelä, Markku |
Journal of publication | Dalton transactions (Cambridge, England : 2003) |
Year of publication | 2011 |
Journal volume | 40 |
Journal issue | 37 |
Pages of publication | 9425 - 9430 |
a | 10.5989 ± 0.0014 Å |
b | 11.003 ± 0.0015 Å |
c | 16.273 ± 0.002 Å |
α | 91.19 ± 0.002° |
β | 96.561 ± 0.002° |
γ | 115.555 ± 0.002° |
Cell volume | 1695.7 ± 0.4 Å3 |
Cell temperature | 120 ± 2 K |
Ambient diffraction temperature | 120 ± 2 K |
Number of distinct elements | 4 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.042 |
Residual factor for significantly intense reflections | 0.035 |
Weighted residual factors for significantly intense reflections | 0.0797 |
Weighted residual factors for all reflections included in the refinement | 0.0892 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.006 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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