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Information card for entry 7017027
Preview
Coordinates | 7017027.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C19 H18 N4 O4 Rh2 S2 |
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Calculated formula | C19 H18 N4 O4 Rh2 S2 |
SMILES | [Rh]1(Sc2[n](ccn2C)[Rh](Sc2[n]1ccn2C)(C#[O])C#[O])(C#[O])C#[O].c1(ccccc1)C |
Title of publication | The oxidative conversion of the N,S-bridged complexes [{RhLL'(μ-X)}(2)] to [(RhLL')(3)(μ-X)(2)](+) (X = mt or taz): a comparison with the oxidation of N,N-bridged analogues. |
Authors of publication | Blagg, Robin J.; López-Gómez, María J; Charmant, Jonathan P. H.; Connelly, Neil G.; Cowell, John J.; Haddow, Mairi F.; Hamilton, Alex; Orpen, A. Guy; Riis-Johannessen, Thomas; Saithong, Saowanit |
Journal of publication | Dalton transactions (Cambridge, England : 2003) |
Year of publication | 2011 |
Journal volume | 40 |
Journal issue | 43 |
Pages of publication | 11497 - 11510 |
a | 6.742 ± 0.0004 Å |
b | 24.9787 ± 0.0015 Å |
c | 14.0857 ± 0.0008 Å |
α | 90° |
β | 100.743 ± 0.001° |
γ | 90° |
Cell volume | 2330.5 ± 0.2 Å3 |
Cell temperature | 173 ± 2 K |
Ambient diffraction temperature | 173 ± 2 K |
Number of distinct elements | 6 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/c 1 |
Hall space group symbol | -P 2ybc |
Residual factor for all reflections | 0.0834 |
Residual factor for significantly intense reflections | 0.0402 |
Weighted residual factors for significantly intense reflections | 0.0864 |
Weighted residual factors for all reflections included in the refinement | 0.0984 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.062 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/7017027.html
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Users of the data should acknowledge the original authors of the
structural data.