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Information card for entry 7017293
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| Coordinates | 7017293.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Common name | H(SmV(TPPS)O)n |
|---|---|
| Chemical name | H[SmV(TPPS)O]n |
| Formula | C44 H26 N4 O13 S4 Sm V |
| Calculated formula | C44 H24 N4 O13 S4 Sm V |
| Title of publication | X-Ray crystal structure of [HSm{V(IV)O(TPPS)}](n) and encapsulation of nitrogen molecules in 1-D channels. |
| Authors of publication | Chen, Wen-Tong; Yamada, Yusuke; Liu, Guang-Ning; Kubota, Akira; Ichikawa, Takayuki; Kojima, Yoshitsugu; Guo, Guo-Cong; Fukuzumi, Shunichi |
| Journal of publication | Dalton transactions (Cambridge, England : 2003) |
| Year of publication | 2011 |
| Journal volume | 40 |
| Journal issue | 48 |
| Pages of publication | 12826 - 12831 |
| a | 15.368 ± 0.003 Å |
| b | 15.368 ± 0.003 Å |
| c | 9.914 ± 0.003 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 2341.4 ± 1 Å3 |
| Cell temperature | 123.15 K |
| Ambient diffraction temperature | 123.15 K |
| Number of distinct elements | 7 |
| Space group number | 124 |
| Hermann-Mauguin space group symbol | P 4/m c c |
| Hall space group symbol | -P 4 2c |
| Residual factor for all reflections | 0.0675 |
| Residual factor for significantly intense reflections | 0.0648 |
| Weighted residual factors for significantly intense reflections | 0.1677 |
| Weighted residual factors for all reflections included in the refinement | 0.1703 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.02 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/7017293.html
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