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Information card for entry 7019858
Preview
Coordinates | 7019858.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C39 H60 O7 Sn4 |
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Calculated formula | C39 H60 O7 Sn4 |
SMILES | [Sn]123[O]([Sn]45[O]([Sn]([O]1c1c(cccc1C(C)C)C(C)C)([O]([Sn]([O]2C)[O]4C)C)[O]35)c1c(cccc1C(C)C)C(C)C)c1c(cccc1C(C)C)C(C)C |
Title of publication | Tin(ii) amide/alkoxide coordination compounds for production of Sn-based nanowires for lithium ion battery anode materials. |
Authors of publication | Boyle, Timothy J.; Doan, Thu Q.; Steele, Leigh Anna M.; Apblett, Christopher; Hoppe, Sarah M.; Hawthorne, Krista; Kalinich, Robin M.; Sigmund, Wolfgang M. |
Journal of publication | Dalton transactions (Cambridge, England : 2003) |
Year of publication | 2012 |
Journal volume | 41 |
Journal issue | 31 |
Pages of publication | 9349 - 9364 |
a | 22.7442 ± 0.0013 Å |
b | 16.4148 ± 0.0009 Å |
c | 23.7362 ± 0.0013 Å |
α | 90° |
β | 90° |
γ | 90° |
Cell volume | 8861.7 ± 0.9 Å3 |
Cell temperature | 273 ± 2 K |
Ambient diffraction temperature | 273 ± 2 K |
Number of distinct elements | 4 |
Space group number | 61 |
Hermann-Mauguin space group symbol | P b c a |
Hall space group symbol | -P 2ac 2ab |
Residual factor for all reflections | 0.0413 |
Residual factor for significantly intense reflections | 0.0301 |
Weighted residual factors for significantly intense reflections | 0.0938 |
Weighted residual factors for all reflections included in the refinement | 0.1074 |
Goodness-of-fit parameter for all reflections included in the refinement | 0.81 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/7019858.html
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