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Information card for entry 7020342
Preview
| Coordinates | 7020342.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Common name | [Cr7Ni(Etglu)F3Piv15]2(3,8-phen) |
|---|---|
| Formula | C178 H306 Cr14 F6 N4 Ni2 O70 |
| Calculated formula | C178 H306 Cr14 F6 N4 Ni2 O70 |
| SMILES | C1(C(C)(C)C)=[O][Ni]234([F][Cr]567([NH](C[C@H]8[C@@H]9[C@H]%10[C@H]%11C[O]%12[Cr]%13%14%15([F][Cr]([F]2)(O1)(OC(C(C)(C)C)=[O]3)([O]=C(C(C)(C)C)O%13)OC(C(C)(C)C)=[O]%14)[O]=C(C(C)(C)C)O[Cr]12%12([O]=C(C(C)(C)C)O%15)OC(C(C)(C)C)=[O][Cr]3%12([O]=C(C(C)(C)C)O1)(OC(C(C)(C)C)=[O][Cr]1%13([O]=C(C(C)(C)C)O3)([O]=C(C(C)(C)C)O[Cr]([O]=C(C(C)(C)C)O1)(OC(C(C)(C)C)=[O]5)([O]=C(C(C)(C)C)O6)([O]78)[O]9%13)[O]%10%12)[O]%112)CC)[O]=C(C(C)(C)C)O4)[n]1cc2c(cc1)c1c(c[n](cc1)[Ni]1345[F][Cr]678([NH](C[C@H]9[C@@H]%10[C@H]%11[C@H]%12C[O]%13[Cr]%14%15%16([F][Cr]([F]1)([O]=C(C(C)(C)C)O3)(OC(C(C)(C)C)=[O]4)([O]=C(C(C)(C)C)O%14)OC(C(C)(C)C)=[O]%15)[O]=C(C(C)(C)C)O[Cr]13%13([O]=C(C(C)(C)C)O%16)OC(C(C)(C)C)=[O][Cr]4%13([O]=C(C(C)(C)C)O1)([O]=C(C(C)(C)C)O[Cr]1%14([O]=C(C(C)(C)C)O4)([O]=C(C(C)(C)C)O[Cr]([O]=C(C(C)(C)C)O1)(OC(C(C)(C)C)=[O]6)([O]=C(C(C)(C)C)O7)([O]89)[O]%10%14)[O]%11%13)[O]%123)CC)[O]=C(C(C)(C)C)O5)cc2 |
| Title of publication | Controlling magnetic communication through aromatic bridges by variation in torsion angle. |
| Authors of publication | Faust, Thomas B.; Tuna, Floriana; Timco, Grigore A.; Affronte, Marco; Bellini, Valerio; Wernsdorfer, Wolfgang; Winpenny, Richard E. P. |
| Journal of publication | Dalton transactions (Cambridge, England : 2003) |
| Year of publication | 2012 |
| Journal volume | 41 |
| Journal issue | 44 |
| Pages of publication | 13626 - 13631 |
| a | 18.75 ± 0.009 Å |
| b | 29.698 ± 0.013 Å |
| c | 24.19 ± 0.011 Å |
| α | 90° |
| β | 112.297 ± 0.005° |
| γ | 90° |
| Cell volume | 12463 ± 10 Å3 |
| Cell temperature | 100 ± 2 K |
| Ambient diffraction temperature | 100 ± 2 K |
| Number of distinct elements | 7 |
| Space group number | 4 |
| Hermann-Mauguin space group symbol | P 1 21 1 |
| Hall space group symbol | P 2yb |
| Residual factor for all reflections | 0.1464 |
| Residual factor for significantly intense reflections | 0.1059 |
| Weighted residual factors for significantly intense reflections | 0.2633 |
| Weighted residual factors for all reflections included in the refinement | 0.3202 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.003 |
| Diffraction radiation wavelength | 0.6889 Å |
| Diffraction radiation type | Synchrotron |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/7020342.html
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