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Information card for entry 7020975
Preview
Coordinates | 7020975.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C38 H86 N8 Na4 P4 |
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Calculated formula | C32 H58.5 N8 Na4 P4 |
SMILES | C(C)(C)(C)N1P2N(C(C)(C)C)P1[N]1(C(C)(C)C)[Na][N]3(P4N(P(N4C(C)(C)C)[N](C(C)(C)C)([Na][N]2(C(C)(C)C)[Na]3)[Na]1)C(C)(C)C)C(C)(C)C |
Title of publication | A planar dianionic ditelluride and a cyclic tritelluride supported by P2N2 rings |
Authors of publication | Nordheider, Andreas; Chivers, Tristram; Thirumoorthi, Ramalingam; Athukorala Arachchige, Kasun S.; Slawin, Alexandra M. Z.; Woollins, J. Derek; Vargas-Baca, Ignacio |
Journal of publication | Dalton Transactions |
Year of publication | 2013 |
Journal volume | 42 |
Journal issue | 10 |
Pages of publication | 3291 |
a | 21.71 ± 0.004 Å |
b | 21.271 ± 0.004 Å |
c | 22.414 ± 0.005 Å |
α | 90° |
β | 106.51 ± 0.03° |
γ | 90° |
Cell volume | 9924 ± 4 Å3 |
Cell temperature | 173 ± 2 K |
Ambient diffraction temperature | 173 ± 2 K |
Number of distinct elements | 5 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/n 1 |
Hall space group symbol | -P 2yn |
Residual factor for all reflections | 0.133 |
Residual factor for significantly intense reflections | 0.0991 |
Weighted residual factors for significantly intense reflections | 0.2652 |
Weighted residual factors for all reflections included in the refinement | 0.2919 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.036 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | Yes |
Has Fobs | No |
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