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Information card for entry 7021202
Preview
Coordinates | 7021202.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C25 H40 Cl2 N6 Ni O4 P2 S4 |
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Calculated formula | C25 H40 Cl2 N6 Ni O4 P2 S4 |
SMILES | [Ni]1234([S]=P(OC(C)C)(OC(C)C)N1C(=S)Nc1[n]2cccc1)[S]=P(OC(C)C)(OC(C)C)N3C(=S)Nc1[n]4cccc1.C(Cl)Cl |
Title of publication | Complexation properties of N-thiophosphorylated thiourea 2-PyNHC(S)NHP(S)(OiPr)2 towards Ni(II). |
Authors of publication | Safin, Damir A; Babashkina, Maria G; Kubisiak, Piotr; Mitoraj, Mariusz P; Robeyns, Koen; Goovaerts, Etienne; Garcia, Yann |
Journal of publication | Dalton transactions (Cambridge, England : 2003) |
Year of publication | 2013 |
Journal volume | 42 |
Journal issue | 15 |
Pages of publication | 5252 - 5257 |
a | 11.5622 ± 0.0006 Å |
b | 16.9673 ± 0.0008 Å |
c | 20.7405 ± 0.0009 Å |
α | 85.69 ± 0.004° |
β | 82.885 ± 0.004° |
γ | 71.258 ± 0.004° |
Cell volume | 3820.7 ± 0.3 Å3 |
Cell temperature | 173 ± 2 K |
Ambient diffraction temperature | 173 ± 2 K |
Number of distinct elements | 8 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.1078 |
Residual factor for significantly intense reflections | 0.0775 |
Weighted residual factors for significantly intense reflections | 0.2123 |
Weighted residual factors for all reflections included in the refinement | 0.2323 |
Goodness-of-fit parameter for all reflections included in the refinement | 0.909 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/7021202.html
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