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Information card for entry 7021403
Preview
Coordinates | 7021403.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C58 H60 P2 Pb2 S4 |
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Calculated formula | C58 H60 P2 Pb2 S4 |
SMILES | S(c1c(C)cccc1C)[Pb](Sc1c(cccc1C)C)[P](CC[P](c1ccccc1)(c1ccccc1)[Pb](Sc1c(cccc1C)C)Sc1c(cccc1C)C)(c1ccccc1)c1ccccc1 |
Title of publication | Structural variation in ethylenediamine and -diphosphine adducts of (2,6-Me2C6H3S)2Pb: a single crystal X-ray diffraction and (207)Pb solid-state NMR spectroscopy study. |
Authors of publication | Rossini, Aaron J.; Macgregor, Alan W.; Smith, Anita S.; Schatte, Gabriele; Schurko, Robert W.; Briand, Glen G. |
Journal of publication | Dalton transactions (Cambridge, England : 2003) |
Year of publication | 2013 |
Journal volume | 42 |
Journal issue | 26 |
Pages of publication | 9533 - 9546 |
a | 10.0551 ± 0.0002 Å |
b | 11.3774 ± 0.0002 Å |
c | 12.8875 ± 0.0003 Å |
α | 87.0455 ± 0.0009° |
β | 71.5348 ± 0.001° |
γ | 81.6016 ± 0.0007° |
Cell volume | 1383.42 ± 0.05 Å3 |
Cell temperature | 173 ± 2 K |
Ambient diffraction temperature | 173 ± 2 K |
Number of distinct elements | 5 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.049 |
Residual factor for significantly intense reflections | 0.0381 |
Weighted residual factors for significantly intense reflections | 0.0731 |
Weighted residual factors for all reflections included in the refinement | 0.0766 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.049 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/7021403.html
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Users of the data should acknowledge the original authors of the
structural data.