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Information card for entry 7022611
Preview
Coordinates | 7022611.cif |
---|---|
Original paper (by DOI) | HTML |
Common name | compound2 |
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Formula | C21 H18 O12 Ru4 Si2 |
Calculated formula | C21 H18 O12 Ru4 Si2 |
SMILES | [C]12(=[C]34[Ru]5672(C#[O])(C#[O])C(=O)[Ru]15(C#[O])(C#[O])(C#[O])[Ru]1247([C]=3([Ru]62(C#[O])(C#[O])(C#[O])C1=O)[Si](C)(C)C)(C#[O])C#[O])[Si](C)(C)C |
Title of publication | Coupling of acetylene molecules on ruthenium clusters, involving cleavage of C-Si bonds in the alkyne and coordination of a phenyl ring of a SiPh3 group. |
Authors of publication | González-López, Vianney; Leyva, Marco A.; Rosales-Hoz, María J |
Journal of publication | Dalton transactions (Cambridge, England : 2003) |
Year of publication | 2013 |
Journal volume | 42 |
Journal issue | 15 |
Pages of publication | 5401 - 5411 |
a | 9.7557 ± 0.0014 Å |
b | 9.7557 ± 0.0014 Å |
c | 27.274 ± 0.006 Å |
α | 90° |
β | 90° |
γ | 120° |
Cell volume | 2248 ± 0.7 Å3 |
Cell temperature | 123 ± 2 K |
Ambient diffraction temperature | 123 ± 2 K |
Number of distinct elements | 5 |
Space group number | 152 |
Hermann-Mauguin space group symbol | P 31 2 1 |
Hall space group symbol | P 31 2" |
Residual factor for all reflections | 0.0666 |
Residual factor for significantly intense reflections | 0.041 |
Weighted residual factors for significantly intense reflections | 0.0581 |
Weighted residual factors for all reflections included in the refinement | 0.0639 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.05 |
Diffraction radiation probe | x-ray |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/7022611.html
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