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Information card for entry 7023137
Preview
| Coordinates | 7023137.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Common name | [In(S~2~CPip]0.5(py) |
|---|---|
| Chemical name | In(N,N-pentamethylenethiocarbamato)3.0.5pyridine solvate |
| Formula | C20.5 H32.5 In N3.5 S6 |
| Calculated formula | C20.5 H32.5 In N3.5 S6 |
| Title of publication | Development of molecular precursors for deposition of indium sulphide thin film electrodes for photoelectrochemical applications. |
| Authors of publication | Ehsan, Muhammad Ali; Peiris, T. A. Nirmal; Wijayantha, K. G. Upul; Olmstead, Marilyn M.; Arifin, Zainudin; Mazhar, Muhammad; Lo, K. M.; McKee, Vickie |
| Journal of publication | Dalton transactions (Cambridge, England : 2003) |
| Year of publication | 2013 |
| Journal volume | 42 |
| Journal issue | 30 |
| Pages of publication | 10919 - 10928 |
| a | 9.4396 ± 0.0002 Å |
| b | 10.7753 ± 0.0003 Å |
| c | 14.0452 ± 0.0003 Å |
| α | 93.148 ± 0.002° |
| β | 91.655 ± 0.002° |
| γ | 107.443 ± 0.003° |
| Cell volume | 1359.31 ± 0.06 Å3 |
| Cell temperature | 100 K |
| Ambient diffraction temperature | 100 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0174 |
| Residual factor for significantly intense reflections | 0.0162 |
| Weighted residual factors for significantly intense reflections | 0.0395 |
| Weighted residual factors for all reflections included in the refinement | 0.0403 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.06 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
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Users of the data should acknowledge the original authors of the
structural data.