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Information card for entry 7024301
Preview
Coordinates | 7024301.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C20 H20 F5 N Si2 Zr |
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Calculated formula | C20 H20 F5 N Si2 Zr |
SMILES | [Zr]123456789%10(N([Si]([c]%112[cH]3[cH]8[cH]%10[cH]7%11)(C)C)[Si]([c]24[cH]1[cH]9[cH]5[cH]62)(C)C)c1c(F)c(F)c(F)c(F)c1F |
Title of publication | The amido-bridged zirconocene's reactivity and catalytic behavior for ethylene polymerization. |
Authors of publication | Wang, Cun; van Meurs, Martin; Stubbs, Ludger P.; Tay, Boon-Ying; Tan, Xiang-Jie; Aitipamula, Srinivasulu; Chacko, Jacob; Luo, He-Kuan; Wong, Pui-Kwan; Ye, Suming |
Journal of publication | Dalton transactions (Cambridge, England : 2003) |
Year of publication | 2010 |
Journal volume | 39 |
Journal issue | 3 |
Pages of publication | 807 - 814 |
a | 11.491 ± 0.002 Å |
b | 10.952 ± 0.002 Å |
c | 17.244 ± 0.003 Å |
α | 90° |
β | 100.2 ± 0.03° |
γ | 90° |
Cell volume | 2135.8 ± 0.7 Å3 |
Cell temperature | 180.15 K |
Ambient diffraction temperature | 180.15 K |
Number of distinct elements | 6 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/n 1 |
Hall space group symbol | -P 2yn |
Residual factor for all reflections | 0.0625 |
Residual factor for significantly intense reflections | 0.0593 |
Weighted residual factors for significantly intense reflections | 0.1278 |
Weighted residual factors for all reflections included in the refinement | 0.13 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.146 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/7024301.html
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Users of the data should acknowledge the original authors of the
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