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Information card for entry 7024380
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Coordinates | 7024380.cif |
---|---|
Original paper (by DOI) | HTML |
Common name | tetrafluoro-tetrakis(dimethylsulfide-S)niobium(V) hexafluoroniobate(V) |
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Chemical name | tetrafluoro-tetrakis(dimethylsulfide-S)niobium(V) hexafluoroniobate(V) |
Formula | C8 H24 F10 Nb2 S4 |
Calculated formula | C8 H24 F10 Nb2 S4 |
SMILES | C[S]([Nb](F)(F)(F)(F)([S](C)C)([S](C)C)[S](C)C)C.F[Nb](F)(F)(F)(F)[F-] |
Title of publication | Six- and eight-coordinate thio- and seleno-ether complexes of NbF5 and some comparisons with NbCl5 and NbBr5 adducts. |
Authors of publication | Jura, Marek; Levason, William; Ratnani, Raju; Reid, Gillian; Webster, Michael |
Journal of publication | Dalton transactions (Cambridge, England : 2003) |
Year of publication | 2010 |
Journal volume | 39 |
Journal issue | 3 |
Pages of publication | 883 - 891 |
a | 12.283 ± 0.005 Å |
b | 12.283 ± 0.005 Å |
c | 13.86 ± 0.004 Å |
α | 90° |
β | 90° |
γ | 90° |
Cell volume | 2091.1 ± 1.3 Å3 |
Cell temperature | 120 ± 2 K |
Ambient diffraction temperature | 120 ± 2 K |
Number of distinct elements | 5 |
Space group number | 130 |
Hermann-Mauguin space group symbol | P 4/n c c :2 |
Hall space group symbol | -P 4a 2ac |
Residual factor for all reflections | 0.1033 |
Residual factor for significantly intense reflections | 0.069 |
Weighted residual factors for significantly intense reflections | 0.1236 |
Weighted residual factors for all reflections included in the refinement | 0.1347 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.199 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/7024380.html
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