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Information card for entry 7024545
Preview
Coordinates | 7024545.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C20 H18 B2 Cu2 F8 N4 O2 |
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Calculated formula | C20 H18 B2 Cu2 F8 N4 O2 |
SMILES | [B](F)(F)(F)[F-].c12c3cccc[n]3[Cu]34([n]2cccc1)[Cu]1([n]2c(c5cccc[n]15)cccc2)([OH]3)[OH]4.[B](F)(F)(F)[F-] |
Title of publication | High pressure studies of hydroxo-bridged Cu(II) dimers. |
Authors of publication | Prescimone, Alessandro; Sanchez-Benitez, Javier; Kamenev, Konstantin K.; Moggach, Stephen A.; Warren, John E.; Lennie, Alistair R.; Murrie, Mark; Parsons, Simon; Brechin, Euan K. |
Journal of publication | Dalton transactions (Cambridge, England : 2003) |
Year of publication | 2010 |
Journal volume | 39 |
Journal issue | 1 |
Pages of publication | 113 - 123 |
a | 13.0669 ± 0.0018 Å |
b | 14.932 ± 0.002 Å |
c | 6.1859 ± 0.0005 Å |
α | 90° |
β | 114.558 ± 0.007° |
γ | 90° |
Cell volume | 1097.8 ± 0.2 Å3 |
Cell temperature | 300 K |
Ambient diffraction temperature | 300 K |
Ambient diffracton pressure | 800000 kPa |
Number of distinct elements | 7 |
Space group number | 12 |
Hermann-Mauguin space group symbol | C 1 2/m 1 |
Hall space group symbol | -C 2y |
Residual factor for all reflections | 0.0489 |
Residual factor for significantly intense reflections | 0.0388 |
Weighted residual factors for all reflections | 0.0616 |
Weighted residual factors for significantly intense reflections | 0.0601 |
Weighted residual factors for all reflections included in the refinement | 0.0616 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.9123 |
Diffraction radiation wavelength | 0.4767 Å |
Diffraction radiation type | Synchrotron |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/7024545.html
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Users of the data should acknowledge the original authors of the
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