Information card for entry 7024616

Structure parameters

• Formula: C63 H42 Cl2 O14 P2 Ru5 Te
• Calculated formula: C63 H42 Cl2 O14 P2 Ru5 Te
• SMILES: [Te]123[Ru]456([Ru]781([Ru]192([Ru]34([Ru]571(C#[O])(C#[O])C#[O])(C9=O)(C#[O])C#[O])(C8=O)(C#[O])C#[O])(C6=O)(C#[O])C#[O])(C#[O])C#[O].ClCCl.[P+](c1ccccc1)(c1ccccc1)(c1ccccc1)c1ccccc1.[P+](c1ccccc1)(c1ccccc1)(c1ccccc1)c1ccccc1
• Title of publication: Bimetallic Ru-Cu tellurido complexes: controlled synthesis and electrochemical studies of copper halide-TeRu(5) and Te(2)Ru(4) clusters.
• Authors of publication: Shieh, Minghuey; Chu, Yen-Yi; Miu, Chia-Yeh; Wu, Pei-Fan; Zeng, Tsau-Ming
• Journal of publication: Dalton transactions (Cambridge, England : 2003)
• Year of publication: 2010
• Journal volume: 39
• Journal issue: 6
• Pages of publication: 1492 - 1503
• a: 12.0433 ± 0.0002 Å
• b: 13.4142 ± 0.0002 Å
• c: 22.8615 ± 0.0006 Å
• α: 74.144 ± 0.001°
• β: 77.353 ± 0.001°
• γ: 67.112 ± 0.001°
• Cell volume: 3246.49 ± 0.12 ų
• Cell temperature: 298 ± 2 K
• Ambient diffraction temperature: 298 ± 2 K
• Number of distinct elements: 7
• Space group number: 2
• Hermann-Mauguin space group symbol: P -1
• Hall space group symbol: -P 1
• Residual factor for all reflections: 0.0812
• Residual factor for significantly intense reflections: 0.0446
• Weighted residual factors for significantly intense reflections: 0.1106
• Weighted residual factors for all reflections included in the refinement: 0.1363
• Goodness-of-fit parameter for all reflections included in the refinement: 1.063
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No