Information card for entry 7024619

Structure parameters

• Formula: C62 H40 Cu I O14 P2 Ru5 Te
• Calculated formula: C62 H40 Cu I O14 P2 Ru5 Te
• SMILES: I[Cu]123[Ru]4567([Te]89[Ru]%10%114([Ru]48([Ru]159([Ru]26%104(C#[O])(C#[O])C#[O])(C#[O])(C#[O])C#[O])(C%11=O)(C#[O])C#[O])(C7=O)(C#[O])C#[O])(C#[O])C3=O.[P+](c1ccccc1)(c1ccccc1)(c1ccccc1)c1ccccc1.[P+](c1ccccc1)(c1ccccc1)(c1ccccc1)c1ccccc1
• Title of publication: Bimetallic Ru-Cu tellurido complexes: controlled synthesis and electrochemical studies of copper halide-TeRu(5) and Te(2)Ru(4) clusters.
• Authors of publication: Shieh, Minghuey; Chu, Yen-Yi; Miu, Chia-Yeh; Wu, Pei-Fan; Zeng, Tsau-Ming
• Journal of publication: Dalton transactions (Cambridge, England : 2003)
• Year of publication: 2010
• Journal volume: 39
• Journal issue: 6
• Pages of publication: 1492 - 1503
• a: 9.938 ± 0.00029 Å
• b: 15.1727 ± 0.0004 Å
• c: 22.0299 ± 0.0007 Å
• α: 77.124 ± 0.001°
• β: 88.458 ± 0.001°
• γ: 73.903 ± 0.001°
• Cell volume: 3109.16 ± 0.16 ų
• Cell temperature: 200 ± 2 K
• Ambient diffraction temperature: 200 ± 2 K
• Number of distinct elements: 8
• Space group number: 2
• Hermann-Mauguin space group symbol: P -1
• Hall space group symbol: -P 1
• Residual factor for all reflections: 0.1597
• Residual factor for significantly intense reflections: 0.0674
• Weighted residual factors for significantly intense reflections: 0.142
• Weighted residual factors for all reflections included in the refinement: 0.1845
• Goodness-of-fit parameter for all reflections included in the refinement: 0.999
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No