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Information card for entry 7024950
Preview
| Coordinates | 7024950.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C28 H56 Cu N6 O2 S2 |
|---|---|
| Calculated formula | C28 H56 Cu N6 O2 S2 |
| SMILES | C(C)(C)N(C(C)C)C1=[S][Cu]2(OC(=N1)N(C(C)C)C(C)C)OC(=NC(N(C(C)C)C(C)C)=[S]2)N(C(C)C)C(C)C |
| Title of publication | Metal complexes of thiobiurets and dithiobiurets: Novel single source precursors for metal sulfide thin film nanostructures. |
| Authors of publication | Ramasamy, Karthik; Malik, Mohammad A.; O'Brien, Paul; Raftery, James |
| Journal of publication | Dalton transactions (Cambridge, England : 2003) |
| Year of publication | 2010 |
| Journal volume | 39 |
| Journal issue | 6 |
| Pages of publication | 1460 - 1463 |
| a | 7.952 ± 0.002 Å |
| b | 11.127 ± 0.003 Å |
| c | 11.142 ± 0.003 Å |
| α | 65.992 ± 0.006° |
| β | 72.469 ± 0.005° |
| γ | 79.123 ± 0.006° |
| Cell volume | 856.3 ± 0.4 Å3 |
| Cell temperature | 100 ± 2 K |
| Ambient diffraction temperature | 100 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.1681 |
| Residual factor for significantly intense reflections | 0.0471 |
| Weighted residual factors for significantly intense reflections | 0.0682 |
| Weighted residual factors for all reflections included in the refinement | 0.0896 |
| Goodness-of-fit parameter for all reflections included in the refinement | 0.491 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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