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Information card for entry 7025174
Preview
Coordinates | 7025174.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C52 H44 N4 O4 Zn2 |
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Calculated formula | C52 H44 N4 O4 Zn2 |
SMILES | c12c(C=[N]3c4ccccc4[N]4=Cc5cccc(c5O[Zn]534[O]1[Zn]134[N](=Cc6c(c(ccc6)CC=C)[O]51)c1ccccc1[N]4=Cc1c(O3)c(ccc1)CC=C)CC=C)cccc2CC=C |
Title of publication | Self-assembly of Zn(salphen) complexes: steric regulation, stability studies and crystallographic analysis revealing an unexpected dimeric 3,3'-t-Bu-substituted Zn(salphen) complex. |
Authors of publication | Martínez Belmonte, Marta; Wezenberg, Sander J.; Haak, Robert M.; Anselmo, Daniele; Escudero-Adán, Eduardo C; Benet-Buchholz, Jordi; Kleij, Arjan W. |
Journal of publication | Dalton transactions (Cambridge, England : 2003) |
Year of publication | 2010 |
Journal volume | 39 |
Journal issue | 19 |
Pages of publication | 4541 - 4550 |
a | 14.6644 ± 0.0005 Å |
b | 12.6647 ± 0.0004 Å |
c | 22.4167 ± 0.0006 Å |
α | 90° |
β | 90° |
γ | 90° |
Cell volume | 4163.2 ± 0.2 Å3 |
Cell temperature | 100 ± 2 K |
Ambient diffraction temperature | 100 ± 2 K |
Number of distinct elements | 5 |
Space group number | 29 |
Hermann-Mauguin space group symbol | P c a 21 |
Hall space group symbol | P 2c -2ac |
Residual factor for all reflections | 0.0403 |
Residual factor for significantly intense reflections | 0.0322 |
Weighted residual factors for significantly intense reflections | 0.0723 |
Weighted residual factors for all reflections included in the refinement | 0.0748 |
Goodness-of-fit parameter for all reflections included in the refinement | 0.982 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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Users of the data should acknowledge the original authors of the
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