Information card for entry 7025813

Structure parameters

• Common name: (tBu2MeSi)4Si4RuCpK
• Chemical name: (tBu2MeSi)4Si4RuCpK
• Formula: C54 H115 K O2 Ru Si8
• Calculated formula: C54 H115 K O2 Ru Si8
• SMILES: [Ru]1234567([Si]89(=[Si]%101([K]18([Si]2%10(=[Si]391[Si](C)(C(C)(C)C)C(C)(C)C)[Si](C)(C(C)(C)C)C(C)(C)C)([O]1CCCC1)[O]1CCCC1)[Si](C)(C(C)(C)C)C(C)(C)C)[Si](C)(C(C)(C)C)C(C)(C)C)[c]1([c]4([c]5([c]6([c]71C)C)C)C)C
• Title of publication: A two-and-a-half-layer sandwich: potassium salt of anionic (η(4)-tetrasilacyclobutadiene)(η(5)-cyclopentadienyl)ruthenium.
• Authors of publication: Lee, Vladimir Ya; Takanashi, Kazunori; Sekiguchi, Akira
• Journal of publication: Dalton transactions (Cambridge, England : 2003)
• Year of publication: 2010
• Journal volume: 39
• Journal issue: 39
• Pages of publication: 9229 - 9231
• a: 20.564 ± 0.0005 Å
• b: 44.936 ± 0.0004 Å
• c: 14.288 ± 0.0013 Å
• α: 90°
• β: 90°
• γ: 90°
• Cell volume: 13203 ± 1.2 ų
• Cell temperature: 150 ± 0.1 K
• Ambient diffraction temperature: 150 ± 0.1 K
• Number of distinct elements: 6
• Space group number: 56
• Hermann-Mauguin space group symbol: P c c n
• Hall space group symbol: -P 2ab 2ac
• Residual factor for all reflections: 0.1088
• Residual factor for significantly intense reflections: 0.0639
• Weighted residual factors for significantly intense reflections: 0.147
• Weighted residual factors for all reflections included in the refinement: 0.1697
• Goodness-of-fit parameter for all reflections included in the refinement: 1.019
• Diffraction radiation wavelength: 0.7107 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No