Crystallography Open Database
- COD Home
- Accessing COD Data
- Add Your Data
- Documentation
Information card for entry 7026146
Preview
Coordinates | 7026146.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C39 H59 Ir N2 Si |
---|---|
Calculated formula | C39 H55 Ir N2 Si |
SMILES | C1(=C)C=C(C)N(c2c(cccc2C(C)C)C(C)C)[Si](=[Ir]2345[c]6([c]5([c]4([c]3([c]26C)C)C)C)C)N1c1c(cccc1C(C)C)C(C)C |
Title of publication | Addition of [(eta(5)-C(5)Me(5))IrH(4)] to a zwitterionic silylene: stepwise formation of iridium(V)-silyl and iridium(III)-silylene complexes. |
Authors of publication | Jungton, Ann-Katrin; Meltzer, Antje; Präsang, Carsten; Braun, Thomas; Driess, Matthias; Penner, Anna |
Journal of publication | Dalton transactions (Cambridge, England : 2003) |
Year of publication | 2010 |
Journal volume | 39 |
Journal issue | 23 |
Pages of publication | 5436 - 5438 |
a | 18.1058 ± 0.0004 Å |
b | 11.9735 ± 0.0003 Å |
c | 16.776 ± 0.0005 Å |
α | 90° |
β | 90° |
γ | 90° |
Cell volume | 3636.87 ± 0.16 Å3 |
Cell temperature | 100 ± 2 K |
Ambient diffraction temperature | 100 ± 2 K |
Number of distinct elements | 5 |
Space group number | 33 |
Hermann-Mauguin space group symbol | P n a 21 |
Hall space group symbol | P 2c -2n |
Residual factor for all reflections | 0.0508 |
Residual factor for significantly intense reflections | 0.0376 |
Weighted residual factors for significantly intense reflections | 0.0586 |
Weighted residual factors for all reflections included in the refinement | 0.0609 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.076 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/7026146.html
All data in the COD and the database itself are dedicated to the
public domain and licensed under the
CC0
License
.
Users of the data should acknowledge the original authors of the
structural data.