Information card for entry 7026343

Structure parameters

• Common name: [{Ce(O)(N(SiMe3)2)2}3]
• Formula: C36 H108 Ce3 N6 O3 Si12
• Calculated formula: C36 H108 Ce3 N6 O3 Si12
• SMILES: [Ce]1(O[Ce](O[Ce](O1)(N([Si](C)(C)C)[Si](C)(C)C)N([Si](C)(C)C)[Si](C)(C)C)(N([Si](C)(C)C)[Si](C)(C)C)N([Si](C)(C)C)[Si](C)(C)C)(N([Si](C)(C)C)[Si](C)(C)C)N([Si](C)(C)C)[Si](C)(C)C
• Title of publication: Crystalline amidocerium(IV) oxides and a side-on bridging dioxygen complex.
• Authors of publication: Coles, Martyn P.; Hitchcock, Peter B.; Khvostov, Alexei V.; Lappert, Michael F.; Li, Zhengning; Protchenko, Andrey V.
• Journal of publication: Dalton transactions (Cambridge, England : 2003)
• Year of publication: 2010
• Journal volume: 39
• Journal issue: 29
• Pages of publication: 6780 - 6788
• a: 12.4998 ± 0.0002 Å
• b: 21.647 ± 0.0006 Å
• c: 26.9181 ± 0.0007 Å
• α: 83.767 ± 0.001°
• β: 78.217 ± 0.002°
• γ: 79.11 ± 0.002°
• Cell volume: 6983.1 ± 0.3 ų
• Cell temperature: 173 ± 2 K
• Ambient diffraction temperature: 173 ± 2 K
• Number of distinct elements: 6
• Space group number: 2
• Hermann-Mauguin space group symbol: P -1
• Hall space group symbol: -P 1
• Residual factor for all reflections: 0.0704
• Residual factor for significantly intense reflections: 0.0445
• Weighted residual factors for significantly intense reflections: 0.082
• Weighted residual factors for all reflections included in the refinement: 0.0912
• Goodness-of-fit parameter for all reflections included in the refinement: 1.032
• Diffraction radiation probe: x-ray
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No