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Information card for entry 7026454
Preview
| Coordinates | 7026454.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C25 H32 Cl4 N2 Ni P2 |
|---|---|
| Calculated formula | C25 H32 Cl4 N2 Ni P2 |
| Title of publication | Coordination chemistry of new selective ethylene trimerisation ligand Ph2PN(iPr)P(Ph)NH(R) (R = iPr, Et) and tests in catalysis. |
| Authors of publication | Aluri, Bhaskar Reddy; Peulecke, Normen; Peitz, Stephan; Spannenberg, Anke; Müller, Bernd H; Schulz, Stefan; Drexler, Hans-Joachim; Heller, Detlef; Al-Hazmi, Mohammed H; Mosa, Fuad M.; Wöhl, Anina; Müller, Wolfgang; Rosenthal, Uwe |
| Journal of publication | Dalton transactions (Cambridge, England : 2003) |
| Year of publication | 2010 |
| Journal volume | 39 |
| Journal issue | 34 |
| Pages of publication | 7911 - 7920 |
| a | 8.5768 ± 0.0002 Å |
| b | 18.4703 ± 0.0005 Å |
| c | 18.9358 ± 0.0005 Å |
| α | 97.413 ± 0.002° |
| β | 91.558 ± 0.002° |
| γ | 96.707 ± 0.002° |
| Cell volume | 2951.58 ± 0.13 Å3 |
| Cell temperature | 200 ± 2 K |
| Ambient diffraction temperature | 200 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0515 |
| Residual factor for significantly intense reflections | 0.0314 |
| Weighted residual factors for significantly intense reflections | 0.0709 |
| Weighted residual factors for all reflections included in the refinement | 0.0741 |
| Goodness-of-fit parameter for all reflections included in the refinement | 0.867 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
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