Crystallography Open Database
- COD Home
- Accessing COD Data
- Add Your Data
- Documentation
Information card for entry 7027614
Preview
| Coordinates | 7027614.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C22 H26 Cl I N4 O3 Ru S |
|---|---|
| Calculated formula | C22 H22 Cl I N4 O3 Ru S |
| SMILES | [Ru]12([S](=O)(C)C)(Cl)([n]3ccccc3c3cccc[n]13)[n]1ccccc1c1cccc[n]21.[I-].O.O |
| Title of publication | Preparation and structural elucidation of novel cis ruthenium(II) bis(bipyridine) sulfoxide complexes † |
| Authors of publication | Hesek, Dusan; Inoue, Yoshihisa; Everitt, Simon R. L.; Ishida, Hitoshi; Kunieda, Mieko; Drew, Michael G. B. |
| Journal of publication | Journal of the Chemical Society, Dalton Transactions |
| Year of publication | 1999 |
| Journal issue | 21 |
| Pages of publication | 3701 |
| a | 8.171 ± 0.0017 Å |
| b | 10.372 ± 0.003 Å |
| c | 16.133 ± 0.003 Å |
| α | 79.83 ± 0.02° |
| β | 76.82 ± 0.018° |
| γ | 72.49 ± 0.015° |
| Cell volume | 1261 ± 0.5 Å3 |
| Cell temperature | 293 ± 2 K |
| Ambient diffraction temperature | 293 ± 2 K |
| Number of distinct elements | 8 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0452 |
| Residual factor for significantly intense reflections | 0.0387 |
| Weighted residual factors for significantly intense reflections | 0.1022 |
| Weighted residual factors for all reflections included in the refinement | 0.1115 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.085 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/7027614.html
All data in the COD and the database itself are dedicated to the
public domain and licensed under the
CC0
License
.
Users of the data should acknowledge the original authors of the
structural data.