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Information card for entry 7027687
Preview
Coordinates | 7027687.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C34 H45 Cl7 N2 P2 Si2 Ti |
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Calculated formula | C34 H45 Cl7 N2 P2 Si2 Ti |
SMILES | [Ti]12(Cl)(Cl)(Cl)[N]([Si](C)(C)C)=P(c3ccccc3)(c3ccccc3)C2CP(c2ccccc2)(c2ccccc2)=[N]1[Si](C)(C)C.C(Cl)Cl.C(Cl)Cl |
Title of publication | Facile formation of a titanium‒carbon bond from TiCl4 by HCl elimination: the synthesis and structure of TiCl3[Me3SiNP(Ph)2CHCH2P(Ph)2NSiMe3] † |
Authors of publication | Sarsfield, Mark J.; Thornton-Pett, Mark; Bochmann, Manfred |
Journal of publication | Journal of the Chemical Society, Dalton Transactions |
Year of publication | 1999 |
Journal issue | 19 |
Pages of publication | 3329 |
a | 22.4593 ± 0.0007 Å |
b | 9.4978 ± 0.0003 Å |
c | 21.4978 ± 0.0006 Å |
α | 90° |
β | 113.094 ± 0.0014° |
γ | 90° |
Cell volume | 4218.3 ± 0.2 Å3 |
Cell temperature | 180 ± 2 K |
Ambient diffraction temperature | 180 ± 2 K |
Number of distinct elements | 7 |
Space group number | 9 |
Hermann-Mauguin space group symbol | C 1 c 1 |
Hall space group symbol | C -2yc |
Residual factor for all reflections | 0.0505 |
Residual factor for significantly intense reflections | 0.0476 |
Weighted residual factors for significantly intense reflections | 0.1176 |
Weighted residual factors for all reflections included in the refinement | 0.1201 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.041 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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