Crystallography Open Database
- COD Home
- Accessing COD Data
- Add Your Data
- Documentation
Information card for entry 7027763
Preview
Coordinates | 7027763.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C28 H24 Cl4 N4 O P Re |
---|---|
Calculated formula | C28 H24 Cl4 N4 O P Re |
SMILES | [Re]1(Cl)(Cl)(Cl)([O]=P(c2ccccc2)(c2ccccc2)c2ccccc2)[n]2ccn(c2N=[N]1c1ccc(cc1)Cl)C |
Title of publication | Synthesis, structure and properties of [ReVL(O)Cl3], [ReVL(NR)Cl3], [ReIIIL(OPPh3)Cl3], and [ReIIIL(PPh3)Cl3] [L = 2-(arylazo)-1-methylimidazole, R = aryl] † |
Authors of publication | Chakraborty, Indranil; Bhattacharyya, Sibaprasad; Banerjee, Sangeeta; Kumar Dirghangi, Bimal; Chakravorty, Animesh |
Journal of publication | Journal of the Chemical Society, Dalton Transactions |
Year of publication | 1999 |
Journal issue | 21 |
Pages of publication | 3747 |
a | 11.588 ± 0.006 Å |
b | 15.007 ± 0.005 Å |
c | 17.661 ± 0.008 Å |
α | 90° |
β | 96.52 ± 0.04° |
γ | 90° |
Cell volume | 3051 ± 2 Å3 |
Cell temperature | 293 ± 2 K |
Ambient diffraction temperature | 293 ± 2 K |
Number of distinct elements | 7 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/n 1 |
Hall space group symbol | -P 2yn |
Residual factor for all reflections | 0.1354 |
Residual factor for significantly intense reflections | 0.0658 |
Weighted residual factors for all reflections | 0.2205 |
Weighted residual factors for significantly intense reflections | 0.1582 |
Goodness-of-fit parameter for all reflections | 1.113 |
Goodness-of-fit parameter for significantly intense reflections | 1.117 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/7027763.html
All data in the COD and the database itself are dedicated to the
public domain and licensed under the
CC0
License
.
Users of the data should acknowledge the original authors of the
structural data.