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Information card for entry 7027766
Preview
Coordinates | 7027766.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C30 H29 Cd O3 P S3 |
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Calculated formula | C30 H29 Cd O3 P S3 |
SMILES | [Cd]123(SC(=[O]1)C)(SC(=[O]2)C)SC(=[O]3)C.[P+](c1ccccc1)(c1ccccc1)(c1ccccc1)c1ccccc1 |
Title of publication | Thioacetate complexes of Group 12 metals. Structures of [Ph4P][Zn(SC{O}Me)3(H2O)] and [Ph4P][Cd(SC{O}Me)3] † |
Authors of publication | Sampanthar, Jeyagowry T.; Deivaraj, Theivanayagam C.; Vittal, Jagadese J.; Dean, Philip A. W. |
Journal of publication | Journal of the Chemical Society, Dalton Transactions |
Year of publication | 1999 |
Journal issue | 24 |
Pages of publication | 4419 |
a | 10.7195 ± 0.0001 Å |
b | 13.0561 ± 0.0002 Å |
c | 11.2199 ± 0.0002 Å |
α | 90° |
β | 100.701 ± 0.001° |
γ | 90° |
Cell volume | 1542.97 ± 0.04 Å3 |
Cell temperature | 296 ± 2 K |
Ambient diffraction temperature | 296 ± 2 K |
Number of distinct elements | 6 |
Space group number | 4 |
Hermann-Mauguin space group symbol | P 1 21 1 |
Hall space group symbol | P 2yb |
Residual factor for all reflections | 0.0309 |
Residual factor for significantly intense reflections | 0.0271 |
Weighted residual factors for all reflections | 0.0678 |
Weighted residual factors for significantly intense reflections | 0.0656 |
Goodness-of-fit parameter for all reflections | 1.023 |
Goodness-of-fit parameter for significantly intense reflections | 1.036 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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