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Information card for entry 7027828
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Coordinates | 7027828.cif |
---|---|
Original paper (by DOI) | HTML |
Common name | [(salen)VOV(O)(salen)][ClO4] |
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Formula | C36 H36 Cl N4 O10 V2 |
Calculated formula | C36 H36 Cl N4 O10 V2 |
SMILES | [V]123(Oc4c(C=[N]2CC[N]3=Cc2c(O1)ccc(c2)C)cc(cc4)C)=[O][V]123(Oc4c(C=[N]2CC[N]3=Cc2c(O1)ccc(c2)C)cc(cc4)C)=O.Cl(=O)(=O)(=O)[O-] |
Title of publication | New compounds of tetradentate Schiff bases with vanadium(IV) and vanadium(V) † |
Authors of publication | Choudhary, Nosheen F.; Connelly, Neil G.; Hitchcock, Peter B.; Leigh, G. Jeffery |
Journal of publication | Journal of the Chemical Society, Dalton Transactions |
Year of publication | 1999 |
Journal issue | 24 |
Pages of publication | 4437 |
a | 15.157 ± 0.005 Å |
b | 10.378 ± 0.002 Å |
c | 23.576 ± 0.005 Å |
α | 90° |
β | 93.33 ± 0.02° |
γ | 90° |
Cell volume | 3702.2 ± 1.6 Å3 |
Cell temperature | 293 ± 2 K |
Ambient diffraction temperature | 293 ± 2 K |
Number of distinct elements | 6 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/n 1 |
Hall space group symbol | -P 2yn |
Residual factor for all reflections | 0.1362 |
Residual factor for significantly intense reflections | 0.0752 |
Weighted residual factors for all reflections | 0.2232 |
Weighted residual factors for significantly intense reflections | 0.1796 |
Goodness-of-fit parameter for all reflections | 1.026 |
Goodness-of-fit parameter for significantly intense reflections | 1.12 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/7027828.html
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