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Information card for entry 7027977
Preview
Coordinates | 7027977.cif |
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Original paper (by DOI) | HTML |
Formula | C16 H24 O4 S8 Sn |
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Calculated formula | C16 H24 O4 S8 Sn |
SMILES | [Sn](SC1=C(SCCS1)SC(=O)OCC)(SC1=C(SCCS1)SC(=O)OCC)(C)C |
Title of publication | Formation of thiolene versus dithiolene species from TTBEO. Crystal structures of [Au(ddtCO2Et)(PPh3)] and [Sn(ddtCO2Et)2Me2] {TTBEO = 2,5,7,9-tetrathiabicyclo[4.3.0]non-1(6)-en-8-one; ddtCO2Et = 3-(ethoxycarbonylsulfanyl)-5,6-dihydro-1,4-dithiine-2-thiolate} |
Authors of publication | Cerrada, Elena; García, J. Felipe; Laguna, Mariano; Terroba, Raquel; Villacampa, M. Dolores |
Journal of publication | Journal of the Chemical Society, Dalton Transactions |
Year of publication | 1998 |
Journal issue | 20 |
Pages of publication | 3511 |
a | 7.623 ± 0.003 Å |
b | 20.585 ± 0.004 Å |
c | 17.012 ± 0.003 Å |
α | 90° |
β | 90.53 ± 0.04° |
γ | 90° |
Cell volume | 2669.4 ± 1.3 Å3 |
Cell temperature | 293 ± 2 K |
Ambient diffraction temperature | 293 ± 2 K |
Number of distinct elements | 5 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/c 1 |
Hall space group symbol | -P 2ybc |
Residual factor for all reflections | 0.1185 |
Residual factor for significantly intense reflections | 0.054 |
Weighted residual factors for all reflections | 0.1014 |
Weighted residual factors for significantly intense reflections | 0.0833 |
Goodness-of-fit parameter for all reflections | 1.012 |
Goodness-of-fit parameter for significantly intense reflections | 1.105 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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