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Information card for entry 7027987
Preview
| Coordinates | 7027987.cif |
|---|---|
| Original paper (by DOI) | HTML |
| External links | PubChem |
| Chemical name | Triphenylphosphinesulfide-diiodide |
|---|---|
| Formula | C18 H15 I2 P S |
| Calculated formula | C18 H15 I2 P S |
| SMILES | [S]([I]I)=P(c1ccccc1)(c1ccccc1)c1ccccc1 |
| Title of publication | Crystal structure of triphenylphosphine sulfide diiodine; the first crystallographically characterised 1∶1 molecular charge-transfer complex of a tertiary phosphine sulfide with diiodine |
| Authors of publication | Apperley, David C.; Bricklebank, Neil; Burns, Sally L.; Hibbs, David E.; Hursthouse, Michael B.; Abdul Malik, K. M. |
| Journal of publication | Journal of the Chemical Society, Dalton Transactions |
| Year of publication | 1998 |
| Journal issue | 8 |
| Pages of publication | 1289 |
| a | 12.618 ± 0.002 Å |
| b | 9.454 ± 0.003 Å |
| c | 15.93 ± 0.006 Å |
| α | 90° |
| β | 97.4 ± 0.008° |
| γ | 90° |
| Cell volume | 1884.5 ± 1 Å3 |
| Cell temperature | 293 ± 2 K |
| Ambient diffraction temperature | 293 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/n 1 |
| Hall space group symbol | -P 2yn |
| Residual factor for all reflections | 0.0485 |
| Residual factor for significantly intense reflections | 0.027 |
| Weighted residual factors for all reflections | 0.0572 |
| Weighted residual factors for significantly intense reflections | 0.0543 |
| Goodness-of-fit parameter for all reflections | 0.799 |
| Goodness-of-fit parameter for significantly intense reflections | 0.956 |
| Diffraction radiation wavelength | 0.71069 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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