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Information card for entry 7028856
Preview
Coordinates | 7028856.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C40 H32 Cl Ir N4 O4 S2 |
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Calculated formula | C40 H32 Cl Ir N4 O4 S2 |
SMILES | [Ir]123([n]4ccccc4c4[n]1c(ccc4)c1ccccc1)([n]1ccccc1c1c2cc(cc1)S(=O)(=O)C)[n]1ccccc1c1c3cc(cc1)S(=O)(=O)C.[Cl-] |
Title of publication | Chloride ion impact on materials for light-emitting electrochemical cells. |
Authors of publication | Schneider, Gabriel E.; Bolink, Henk J.; Constable, Edwin C.; Ertl, Cathrin D.; Housecroft, Catherine E.; Pertegàs, Antonio; Zampese, Jennifer A.; Kanitz, Andreas; Kessler, Florian; Meier, Sebastian B. |
Journal of publication | Dalton transactions (Cambridge, England : 2003) |
Year of publication | 2014 |
Journal volume | 43 |
Journal issue | 5 |
Pages of publication | 1961 - 1964 |
a | 10.951 ± 0.0005 Å |
b | 19.9122 ± 0.001 Å |
c | 16.3883 ± 0.0008 Å |
α | 90° |
β | 97.298 ± 0.002° |
γ | 90° |
Cell volume | 3544.7 ± 0.3 Å3 |
Cell temperature | 123 ± 2 K |
Ambient diffraction temperature | 123 ± 2 K |
Number of distinct elements | 7 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/n 1 |
Hall space group symbol | -P 2yn |
Residual factor for all reflections | 0.0356 |
Residual factor for significantly intense reflections | 0.029 |
Weighted residual factors for significantly intense reflections | 0.0679 |
Weighted residual factors for all reflections included in the refinement | 0.0706 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.107 |
Diffraction radiation wavelength | 1.54178 Å |
Diffraction radiation type | CuKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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