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Information card for entry 7028877
Preview
Coordinates | 7028877.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C35 H13 Cl2 Cu F6 N2 O4 Sb |
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Calculated formula | C31 H36 Cl2 Cu F6 N2 O4 Sb |
SMILES | [Sb](F)(F)(F)(F)([F-])F.[Cu]123[N](c4c([N]3=Cc3c(O1)c(cc(OC)c3)C(C)(C)C)cccc4)=Cc1c(O2)c(cc(OC)c1)C(C)(C)C.ClCCl |
Title of publication | Characterization of one-electron oxidized copper(II)-salophen-type complexes; effects of electronic and geometrical structures on reactivities. |
Authors of publication | Asami, Kazutaka; Takashina, Akiko; Kobayashi, Misato; Iwatsuki, Satoshi; Yajima, Tatsuo; Kochem, Amélie; van Gastel, Maurice; Tani, Fumito; Kohzuma, Takamitsu; Thomas, Fabrice; Shimazaki, Yuichi |
Journal of publication | Dalton transactions (Cambridge, England : 2003) |
Year of publication | 2014 |
Journal volume | 43 |
Journal issue | 5 |
Pages of publication | 2283 - 2293 |
a | 10.8962 ± 0.0017 Å |
b | 12.008 ± 0.002 Å |
c | 13.632 ± 0.003 Å |
α | 89.71 ± 0.004° |
β | 81.617 ± 0.004° |
γ | 84.038 ± 0.004° |
Cell volume | 1754.9 ± 0.6 Å3 |
Cell temperature | 173 K |
Ambient diffraction temperature | 173 K |
Number of distinct elements | 8 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for significantly intense reflections | 0.0857 |
Weighted residual factors for all reflections included in the refinement | 0.2547 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.165 |
Diffraction radiation wavelength | 0.71075 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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