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Information card for entry 7029220
Preview
Coordinates | 7029220.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C36 H45 Cl2 O2 P Zr |
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Calculated formula | C36 H45 Cl2 O2 P Zr |
SMILES | [Zr]12345([P](c6ccccc6)(c6c(O1)c(ccc6)C(C)(C)C)c1ccccc1)(Cl)(Cl)([O]1CCCC1)[c]1([c]2([c]3([c]5([c]41C)C)C)C)C |
Title of publication | Synthesis and characterization of phosphine-(thio)phenolate-based half-zirconocenes and their application in ethylene (co-)polymerization. |
Authors of publication | Tang, Xiao-Yan; Long, Ying-Yun; Wang, Yong-Xia; Liu, Jing-Yu; Li, Yue-Sheng |
Journal of publication | Dalton transactions (Cambridge, England : 2003) |
Year of publication | 2014 |
Journal volume | 43 |
Journal issue | 1 |
Pages of publication | 222 - 230 |
a | 8.5278 ± 0.0005 Å |
b | 11.6963 ± 0.0007 Å |
c | 19.2212 ± 0.0012 Å |
α | 91.319 ± 0.001° |
β | 95.453 ± 0.001° |
γ | 110.689 ± 0.001° |
Cell volume | 1782.14 ± 0.19 Å3 |
Cell temperature | 185 ± 2 K |
Ambient diffraction temperature | 185 ± 2 K |
Number of distinct elements | 6 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0516 |
Residual factor for significantly intense reflections | 0.0428 |
Weighted residual factors for significantly intense reflections | 0.0995 |
Weighted residual factors for all reflections included in the refinement | 0.1043 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.055 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/7029220.html
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Users of the data should acknowledge the original authors of the
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