Information card for entry 7029370
| Formula |
C9 H6 I2 S4 |
| Calculated formula |
C9 H6 I2 S4 |
| SMILES |
IC1=C(I)SC(S1)=C1SC2=C(S1)CCC2 |
| Title of publication |
Inter-layer charge disproportionation in the dual-layer organic metal (tTTF-I)2ClO4 with unsymmetrical IO halogen bond interactions. |
| Authors of publication |
Shin, Kyoung-Soon; Jeannin, Olivier; Brezgunova, Mariya; Dahaoui, Slimane; Aubert, Emmanuel; Espinosa, Enrique; Auban-Senzier, Pascale; Swietlik, Roman; FrÄ…ckowiak, Arkadiusz; Fourmigué, Marc |
| Journal of publication |
Dalton transactions (Cambridge, England : 2003) |
| Year of publication |
2014 |
| Journal volume |
43 |
| Journal issue |
14 |
| Pages of publication |
5280 - 5291 |
| a |
7.1693 ± 0.0014 Å |
| b |
9.5474 ± 0.0019 Å |
| c |
19.925 ± 0.004 Å |
| α |
90° |
| β |
96.41 ± 0.03° |
| γ |
90° |
| Cell volume |
1355.3 ± 0.5 Å3 |
| Cell temperature |
293 ± 2 K |
| Ambient diffraction temperature |
293 ± 2 K |
| Number of distinct elements |
4 |
| Space group number |
14 |
| Hermann-Mauguin space group symbol |
P 1 21/n 1 |
| Hall space group symbol |
-P 2yn |
| Residual factor for all reflections |
0.0434 |
| Residual factor for significantly intense reflections |
0.0314 |
| Weighted residual factors for significantly intense reflections |
0.0653 |
| Weighted residual factors for all reflections included in the refinement |
0.0702 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.076 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
No |
For the version history of this entry, please navigate to main COD server.
The link is:
https://www.crystallography.net/7029370.html