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Information card for entry 7029373
Preview
Coordinates | 7029373.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C18 H14 Cl I2 O4 S8 |
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Calculated formula | C18 H14 Cl I2 O4 S8 |
SMILES | Cl(=O)(=O)(=O)[O-].IC1=CSC(S1)=C1SC2=C(S1)CCC2.IC1=CSC(S1)=C1SC2=C(S1)CCC2 |
Title of publication | Inter-layer charge disproportionation in the dual-layer organic metal (tTTF-I)2ClO4 with unsymmetrical IO halogen bond interactions. |
Authors of publication | Shin, Kyoung-Soon; Jeannin, Olivier; Brezgunova, Mariya; Dahaoui, Slimane; Aubert, Emmanuel; Espinosa, Enrique; Auban-Senzier, Pascale; Swietlik, Roman; FrÄ…ckowiak, Arkadiusz; Fourmigué, Marc |
Journal of publication | Dalton transactions (Cambridge, England : 2003) |
Year of publication | 2014 |
Journal volume | 43 |
Journal issue | 14 |
Pages of publication | 5280 - 5291 |
a | 6.5065 ± 0.0005 Å |
b | 7.5823 ± 0.0005 Å |
c | 26.906 ± 0.002 Å |
α | 92.706 ± 0.003° |
β | 92.573 ± 0.003° |
γ | 106.606 ± 0.003° |
Cell volume | 1268.24 ± 0.16 Å3 |
Cell temperature | 150 ± 2 K |
Ambient diffraction temperature | 150 ± 2 K |
Number of distinct elements | 6 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0608 |
Residual factor for significantly intense reflections | 0.0577 |
Weighted residual factors for significantly intense reflections | 0.1457 |
Weighted residual factors for all reflections included in the refinement | 0.1478 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.3 |
Diffraction radiation probe | x-ray |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | Yes |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/7029373.html
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Users of the data should acknowledge the original authors of the
structural data.