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Information card for entry 7030786
Preview
Coordinates | 7030786.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C22 H37 As4 Cl9 Nb2 O |
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Calculated formula | C22 H37 As4 Cl9 Nb2 O |
SMILES | [Nb]12([As](C)(C)c3ccccc3[As]1(C)C)([As](c1c([As]2(C)C)cccc1)(C)C)(Cl)(Cl)(Cl)Cl.[Nb](Cl)(Cl)(Cl)(Cl)(Cl)OCC |
Title of publication | Soft diphosphine and diarsine complexes of niobium(v) and tantalum(v) fluorides: synthesis, properties, structures and comparisons with the corresponding chlorides. |
Authors of publication | Levason, William; Light, Mark E.; Reid, Gillian; Zhang, Wenjian |
Journal of publication | Dalton transactions (Cambridge, England : 2003) |
Year of publication | 2014 |
Journal volume | 43 |
Journal issue | 25 |
Pages of publication | 9557 - 9566 |
a | 12.144 ± 0.002 Å |
b | 12.638 ± 0.003 Å |
c | 14.139 ± 0.003 Å |
α | 108.806 ± 0.002° |
β | 108.034 ± 0.002° |
γ | 102.051 ± 0.002° |
Cell volume | 1834.9 ± 0.7 Å3 |
Cell temperature | 100 ± 2 K |
Ambient diffraction temperature | 100 ± 2 K |
Number of distinct elements | 6 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0458 |
Residual factor for significantly intense reflections | 0.0331 |
Weighted residual factors for significantly intense reflections | 0.0747 |
Weighted residual factors for all reflections included in the refinement | 0.0795 |
Goodness-of-fit parameter for all reflections included in the refinement | 0.958 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/7030786.html
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