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Information card for entry 7031376
Preview
Coordinates | 7031376.cif |
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Original paper (by DOI) | HTML |
Common name | germanium tin antimony telluride |
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Formula | Ge0.6 Sb2 Sn0.4 Te4 |
Calculated formula | Ge0.601 Sb1.999 Sn0.4 Te4 |
Title of publication | Layered germanium tin antimony tellurides: element distribution, nanostructures and thermoelectric properties. |
Authors of publication | Welzmiller, Simon; Rosenthal, Tobias; Ganter, Pirmin; Neudert, Lukas; Fahrnbauer, Felix; Urban, Philipp; Stiewe, Christian; de Boor, Johannes; Oeckler, Oliver |
Journal of publication | Dalton transactions (Cambridge, England : 2003) |
Year of publication | 2014 |
Journal volume | 43 |
Journal issue | 27 |
Pages of publication | 10529 - 10540 |
a | 4.2638 ± 0.0001 Å |
b | 4.2638 ± 0.0001 Å |
c | 41.346 ± 0.003 Å |
α | 90° |
β | 90° |
γ | 120° |
Cell volume | 650.97 ± 0.05 Å3 |
Cell temperature | 293 ± 2 K |
Ambient diffraction temperature | 293 ± 2 K |
Number of distinct elements | 4 |
Space group number | 166 |
Hermann-Mauguin space group symbol | R -3 m :H |
Hall space group symbol | -R 3 2" |
Residual factor for all reflections | 0.0411 |
Residual factor for significantly intense reflections | 0.0362 |
Weighted residual factors for significantly intense reflections | 0.0509 |
Weighted residual factors for all reflections included in the refinement | 0.0516 |
Goodness-of-fit parameter for significantly intense reflections | 1.59 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.46 |
Diffraction radiation probe | x-ray |
Diffraction radiation wavelength | 0.42468 Å |
Diffraction radiation type | synchrotron |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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