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Information card for entry 7031475
Preview
Coordinates | 7031475.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C30 H83 Mg N7 Na Si6 |
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Calculated formula | C30 H83 Mg N7 Na Si6 |
SMILES | C[Si](C)(C)N([Mg](N([Si](C)(C)C)[Si](C)(C)C)N([Si](C)(C)C)[Si](C)(C)C)[Si](C)(C)C.[Na]12([N](C)(CC[N]1(C)C)C)[N](C)(CC[N]2(C)C)C |
Title of publication | Complexity in seemingly simple sodium magnesiate systems. |
Authors of publication | Francos, J.; Fleming, B. J.; García-Álvarez, P; Kennedy, A. R.; Reilly, K.; Robertson, G. M.; Robertson, S. D.; O'Hara, C T |
Journal of publication | Dalton transactions (Cambridge, England : 2003) |
Year of publication | 2014 |
Journal volume | 43 |
Journal issue | 38 |
Pages of publication | 14424 - 14431 |
a | 11.8176 ± 0.001 Å |
b | 11.968 ± 0.0011 Å |
c | 18.4164 ± 0.0016 Å |
α | 94.913 ± 0.007° |
β | 99.478 ± 0.007° |
γ | 103.922 ± 0.008° |
Cell volume | 2472.2 ± 0.4 Å3 |
Cell temperature | 123 ± 2 K |
Ambient diffraction temperature | 123 ± 2 K |
Number of distinct elements | 6 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0927 |
Residual factor for significantly intense reflections | 0.0467 |
Weighted residual factors for significantly intense reflections | 0.0944 |
Weighted residual factors for all reflections included in the refinement | 0.1015 |
Goodness-of-fit parameter for all reflections included in the refinement | 0.864 |
Diffraction radiation wavelength | 0.71069 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | Yes |
Has Fobs | No |
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