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Information card for entry 7031574
Preview
Coordinates | 7031574.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C38.5 H18 Cl2 F20 N2 O2 P2 Ru |
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Calculated formula | C38 H12 Cl2 F20 N2 P2 Ru |
SMILES | [Ru]12([n]3c4c5[n]1cccc5ccc4ccc3)([P](c1c(F)c(F)c(F)c(F)c1F)(CC[P]2(c1c(F)c(F)c(F)c(F)c1F)c1c(F)c(F)c(F)c(F)c1F)c1c(F)c(F)c(F)c(F)c1F)(Cl)Cl |
Title of publication | Synthesis, characterization and reactivity studies of electrophilic ruthenium(ii) complexes: a study of H2 activation and labilization. |
Authors of publication | Naidu, K. S.; Patil, Yogesh P.; Nethaji, Munirathinam; Jagirdar, Balaji R. |
Journal of publication | Dalton transactions (Cambridge, England : 2003) |
Year of publication | 2014 |
Journal volume | 43 |
Journal issue | 35 |
Pages of publication | 13410 - 13423 |
a | 12.597 ± 0.005 Å |
b | 11.179 ± 0.005 Å |
c | 28.426 ± 0.005 Å |
α | 90° |
β | 90.797 ± 0.005° |
γ | 90° |
Cell volume | 4003 ± 2 Å3 |
Cell temperature | 100 ± 2 K |
Ambient diffraction temperature | 100 ± 2 K |
Number of distinct elements | 8 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/c 1 |
Hall space group symbol | -P 2ybc |
Residual factor for all reflections | 0.0577 |
Residual factor for significantly intense reflections | 0.0393 |
Weighted residual factors for significantly intense reflections | 0.0861 |
Weighted residual factors for all reflections included in the refinement | 0.091 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.132 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/7031574.html
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