Information card for entry 7032491

Structure parameters

• Formula: C38 H76 N4 O2 Se2 Si4 Sn2
• Calculated formula: C38 H76 N4 O2 Se2 Si4 Sn2
• SMILES: C[Si](C)(N([Sn]1[O](C(C)(C)C[Se]c2ccccc2CN(C)C)[Sn](N([Si](C)(C)C)[Si](C)(C)C)[O]1C(C)(C)C[Se]c1ccccc1CN(C)C)[Si](C)(C)C)C
• Title of publication: On the coordination chemistry of organochalcogenolates R(NMe2)^E(-) and R(NMe2)^E^O(-) (E = S, Se) onto lead(ii) and lighter divalent tetrel elements.
• Authors of publication: Pop, Alexandra; Wang, Lingfang; Dorcet, Vincent; Roisnel, Thierry; Carpentier, Jean-François; Silvestru, Anca; Sarazin, Yann
• Journal of publication: Dalton transactions (Cambridge, England : 2003)
• Year of publication: 2014
• Journal volume: 43
• Journal issue: 43
• Pages of publication: 16459 - 16474
• a: 10.431 ± 0.005 Å
• b: 10.948 ± 0.002 Å
• c: 11.369 ± 0.004 Å
• α: 100.052 ± 0.013°
• β: 100.25 ± 0.02°
• γ: 94.638 ± 0.017°
• Cell volume: 1249.6 ± 0.8 ų
• Cell temperature: 150 ± 2 K
• Ambient diffraction temperature: 150 ± 2 K
• Number of distinct elements: 7
• Space group number: 2
• Hermann-Mauguin space group symbol: P -1
• Hall space group symbol: -P 1
• Residual factor for all reflections: 0.0839
• Residual factor for significantly intense reflections: 0.0631
• Weighted residual factors for significantly intense reflections: 0.1598
• Weighted residual factors for all reflections included in the refinement: 0.1766
• Goodness-of-fit parameter for all reflections included in the refinement: 1.023
• Diffraction radiation probe: x-ray
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No