Crystallography Open Database
- COD Home
- Accessing COD Data
- Add Your Data
- Documentation
Information card for entry 7032917
Preview
Coordinates | 7032917.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C42 H30 Co4 N13 O4 S6 |
---|---|
Calculated formula | C42 H30 Co4 N13 O4 S6 |
SMILES | c12ccccc2[nH]c2[n]1[Co]13[n]4c5ccccc5[nH]c4S[Co]45[O]61[Co](S2)(Sc1[n]4c2ccccc2[nH]1)Sc1[n](c2ccccc2[nH]1)[Co]6([n]1c(S3)[nH]c2ccccc12)Sc1[n]5c2ccccc2[nH]1.N(=O)(=O)[O-] |
Title of publication | A series of cobalt and nickel clusters based on thiol-containing ligands accompanied by in situ ligand formation. |
Authors of publication | Han, Song-De; Miao, Xiao-Hong; Liu, Sui-Jun; Bu, Xian-He |
Journal of publication | Dalton transactions (Cambridge, England : 2003) |
Year of publication | 2015 |
Journal volume | 44 |
Journal issue | 2 |
Pages of publication | 560 - 567 |
a | 18.737 ± 0.002 Å |
b | 18.737 ± 0.002 Å |
c | 18.737 ± 0.002 Å |
α | 90° |
β | 90° |
γ | 90° |
Cell volume | 6578.1 ± 1.2 Å3 |
Cell temperature | 293 ± 2 K |
Ambient diffraction temperature | 293 ± 2 K |
Number of distinct elements | 6 |
Space group number | 198 |
Hermann-Mauguin space group symbol | P 21 3 |
Hall space group symbol | P 2ac 2ab 3 |
Residual factor for all reflections | 0.0617 |
Residual factor for significantly intense reflections | 0.0562 |
Weighted residual factors for significantly intense reflections | 0.1318 |
Weighted residual factors for all reflections included in the refinement | 0.1345 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.183 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/7032917.html
All data in the COD and the database itself are dedicated to the
public domain and licensed under the
CC0
License
.
Users of the data should acknowledge the original authors of the
structural data.