Information card for entry 7033144
| Formula |
C26 H24 S2 Si |
| Calculated formula |
C26 H24 S2 Si |
| SMILES |
[Si]([C@@H](S)c1ccccc1)([C@H](S)c1ccccc1)(c1ccccc1)c1ccccc1 |
| Title of publication |
A sterically stabilized FeI-FeI semi-rotated conformation of [FeFe] hydrogenase subsite model. |
| Authors of publication |
Goy, Roman; Bertini, Luca; Elleouet, Catherine; Görls, Helmar; Zampella, Giuseppe; Talarmin, Jean; De Gioia, Luca; Schollhammer, Philippe; Apfel, Ulf-Peter; Weigand, Wolfgang |
| Journal of publication |
Dalton transactions (Cambridge, England : 2003) |
| Year of publication |
2015 |
| Journal volume |
44 |
| Journal issue |
4 |
| Pages of publication |
1690 - 1699 |
| a |
12.5725 ± 0.0007 Å |
| b |
10.0053 ± 0.0003 Å |
| c |
18.5969 ± 0.0009 Å |
| α |
90° |
| β |
105.747 ± 0.002° |
| γ |
90° |
| Cell volume |
2251.54 ± 0.18 Å3 |
| Cell temperature |
183 ± 2 K |
| Ambient diffraction temperature |
183 ± 2 K |
| Number of distinct elements |
4 |
| Space group number |
14 |
| Hermann-Mauguin space group symbol |
P 1 21/n 1 |
| Hall space group symbol |
-P 2yn |
| Residual factor for all reflections |
0.0985 |
| Residual factor for significantly intense reflections |
0.0455 |
| Weighted residual factors for significantly intense reflections |
0.0917 |
| Weighted residual factors for all reflections included in the refinement |
0.1074 |
| Goodness-of-fit parameter for all reflections included in the refinement |
0.973 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
No |
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https://www.crystallography.net/7033144.html