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Information card for entry 7033574
Preview
Coordinates | 7033574.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C58 H48 Cl0 Cu2 N8 |
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Calculated formula | C58 H48 Cu2 N8 |
SMILES | C1c2ccc3C(CC)(CC)c4ccc5C=[N]6c7c8c(ccc7)cc7cccc(c7c8)[N]7=Cc8ccc9C(CC)(CC)c%10ccc%11C=[N](c%12c%13c(ccc%12)cc%12cccc([N]=1[Cu]6(n23)n45)c%12c%13)[Cu]7(n89)n%10%11 |
Title of publication | Towards dipyrrins: oxidation and metalation of acyclic and macrocyclic Schiff-base dipyrromethanes. |
Authors of publication | Pankhurst, James R.; Cadenbach, Thomas; Betz, Daniel; Finn, Colin; Love, Jason B. |
Journal of publication | Dalton transactions (Cambridge, England : 2003) |
Year of publication | 2015 |
Journal volume | 44 |
Journal issue | 5 |
Pages of publication | 2066 - 2070 |
a | 12.39 ± 0.0007 Å |
b | 24.4018 ± 0.0014 Å |
c | 19.8715 ± 0.001 Å |
α | 90° |
β | 103.654 ± 0.005° |
γ | 90° |
Cell volume | 5838.1 ± 0.6 Å3 |
Cell temperature | 170 ± 2 K |
Ambient diffraction temperature | 170 ± 2 K |
Number of distinct elements | 5 |
Space group number | 15 |
Hermann-Mauguin space group symbol | C 1 2/c 1 |
Hall space group symbol | -C 2yc |
Residual factor for all reflections | 0.1077 |
Residual factor for significantly intense reflections | 0.0625 |
Weighted residual factors for significantly intense reflections | 0.1587 |
Weighted residual factors for all reflections included in the refinement | 0.1792 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.043 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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