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Information card for entry 7033614
Preview
Coordinates | 7033614.cif |
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Original paper (by DOI) | HTML |
Formula | C44 H52 N4 Ni O4 |
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Calculated formula | C44 H52 N4 Ni O4 |
SMILES | [Ni]123Oc4cc(OCCCN5CCCCC5)ccc4C=[N]2[C@@H]([C@@H]([N]3=Cc2ccc(OCCCN3CCCCC3)cc2O1)c1ccccc1)c1ccccc1 |
Title of publication | Synthesis and characterisation of nickel Schiff base complexes containing the meso-1,2-diphenylethylenediamine moiety: selective interactions with a tetramolecular DNA quadruplex. |
Authors of publication | Davis, Kimberley J.; Richardson, Christopher; Beck, Jennifer L.; Knowles, Brett M.; Guédin, Aurore; Mergny, Jean-Louis; Willis, Anthony C.; Ralph, Stephen F. |
Journal of publication | Dalton transactions (Cambridge, England : 2003) |
Year of publication | 2015 |
Journal volume | 44 |
Journal issue | 7 |
Pages of publication | 3136 - 3150 |
a | 20.0562 ± 0.0007 Å |
b | 10.1772 ± 0.0002 Å |
c | 22.9552 ± 0.0007 Å |
α | 90° |
β | 112.409 ± 0.0013° |
γ | 90° |
Cell volume | 4331.7 ± 0.2 Å3 |
Cell temperature | 200 K |
Ambient diffraction temperature | 200 K |
Number of distinct elements | 5 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/n 1 |
Hall space group symbol | -P 2yn |
Residual factor for all reflections | 0.0854 |
Residual factor for significantly intense reflections | 0.0508 |
Weighted residual factors for all reflections | 0.1475 |
Weighted residual factors for significantly intense reflections | 0.1275 |
Weighted residual factors for all reflections included in the refinement | 0.1475 |
Goodness-of-fit parameter for all reflections included in the refinement | 0.9693 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/7033614.html
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