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Information card for entry 7033910
Preview
Coordinates | 7033910.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C30 H58 Cl6 Cu4 N4 Se8 |
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Calculated formula | C30 H58 Cl6 Cu4 N4 Se8 |
SMILES | C1([Se]2[Cu]3456[Se]=C(N(CCC)CCC)[Se]7[Cu]89%103[Cu]34([Cu]2578[Se]=C(N(CCC)CCC)[Se]93)([Se]=1)[Se]6C(N(CCC)CCC)=[Se]%10)N(CCC)CCC.C(Cl)(Cl)Cl.C(Cl)(Cl)Cl |
Title of publication | Copper(i) diselenocarbamate clusters: synthesis, structures and single-source precursors for Cu and Se composite materials. |
Authors of publication | Dhayal, Rajendra S.; Liao, Jian-Hong; Hou, Hsing-Nan; Ervilita, Ria; Liao, Ping-Kuei; Liu, C. W. |
Journal of publication | Dalton transactions (Cambridge, England : 2003) |
Year of publication | 2015 |
Journal volume | 44 |
Journal issue | 12 |
Pages of publication | 5898 - 5908 |
a | 11.7089 ± 0.0005 Å |
b | 17.4277 ± 0.0007 Å |
c | 26.6735 ± 0.0012 Å |
α | 90° |
β | 90° |
γ | 90° |
Cell volume | 5443 ± 0.4 Å3 |
Cell temperature | 296 ± 2 K |
Ambient diffraction temperature | 296 ± 2 K |
Number of distinct elements | 6 |
Space group number | 60 |
Hermann-Mauguin space group symbol | P c a n |
Hall space group symbol | -P 2n 2c |
Residual factor for all reflections | 0.1028 |
Residual factor for significantly intense reflections | 0.0621 |
Weighted residual factors for significantly intense reflections | 0.1661 |
Weighted residual factors for all reflections included in the refinement | 0.1912 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.05 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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