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Information card for entry 7034602
Preview
Coordinates | 7034602.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C55 H52 Cl6 Cu F6 N2 P3 |
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Calculated formula | C55 H50 Cl6 Cu F6 N2 P3 |
SMILES | [Cu]12([P](c3ccccc3)(c3ccccc3)CC[P]1(c1ccccc1)c1ccccc1)[n]1c(cc(c3ccc4c(cc([n]2c4c13)C)c1ccccc1)c1ccccc1)C.ClCCl.ClCCl.ClCCl.[P](F)(F)(F)(F)(F)[F-] |
Title of publication | Structures and photophysical properties of copper(i) complexes bearing diphenylphenanthroline and bis(diphenylphosphino)alkane: the effect of phenyl groups on the phenanthroline ligand. |
Authors of publication | Tsubomura, Taro; Kimura, Kaoru; Nishikawa, Michihiro; Tsukuda, Toshiaki |
Journal of publication | Dalton transactions (Cambridge, England : 2003) |
Year of publication | 2015 |
Journal volume | 44 |
Journal issue | 16 |
Pages of publication | 7554 - 7562 |
a | 14.1782 ± 0.0005 Å |
b | 14.2519 ± 0.0005 Å |
c | 27.434 ± 0.0011 Å |
α | 90° |
β | 98.546 ± 0.001° |
γ | 90° |
Cell volume | 5481.9 ± 0.4 Å3 |
Cell temperature | 123 ± 2 K |
Ambient diffraction temperature | 123 ± 2 K |
Number of distinct elements | 7 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/n 1 |
Hall space group symbol | -P 2yn |
Residual factor for all reflections | 0.0574 |
Residual factor for significantly intense reflections | 0.0547 |
Weighted residual factors for significantly intense reflections | 0.1329 |
Weighted residual factors for all reflections included in the refinement | 0.1352 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.118 |
Diffraction radiation wavelength | 0.7107 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/7034602.html
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