Information card for entry 7035213

Structure parameters

• Chemical name: iPrGe10
• Formula: C80 H140 Ge10
• Calculated formula: C80 H140 Ge10
• SMILES: C1#C[Ge](C#C[Ge](C#C[Ge](C#C[Ge](C(C)C)(C#C[Ge](C#C[Ge](C#C[Ge](C#C[Ge](C#C[Ge](C#C[Ge]1(C(C)C)C(C)C)(C(C)C)C(C)C)(C(C)C)C(C)C)(C(C)C)C(C)C)(C(C)C)C(C)C)(C(C)C)C(C)C)C(C)C)(C(C)C)C(C)C)(C(C)C)C(C)C)(C(C)C)C(C)C
• Title of publication: Stepwise synthesis and characterization of germa[4], [5], [8], and [10]pericyclynes.
• Authors of publication: Tanimoto, Hiroki; Nagao, Tomohiko; Fujiwara, Taro; Nishiyama, Yasuhiro; Morimoto, Tsumoru; Suzuka, Toshimasa; Tsutsumi, Ken; Kakiuchi, Kiyomi
• Journal of publication: Dalton transactions (Cambridge, England : 2003)
• Year of publication: 2015
• Journal volume: 44
• Journal issue: 26
• Pages of publication: 11811 - 11818
• a: 8.62692 ± 0.00016 Å
• b: 16.1073 ± 0.0003 Å
• c: 18.5212 ± 0.0003 Å
• α: 105.931 ± 0.0007°
• β: 96.9004 ± 0.0007°
• γ: 104.537 ± 0.0007°
• Cell volume: 2345.65 ± 0.07 ų
• Cell temperature: 123 ± 2 K
• Ambient diffraction temperature: 123 ± 2 K
• Number of distinct elements: 3
• Space group number: 2
• Hermann-Mauguin space group symbol: P -1
• Hall space group symbol: -P 1
• Residual factor for all reflections: 0.0189
• Residual factor for significantly intense reflections: 0.017
• Weighted residual factors for significantly intense reflections: 0.0432
• Weighted residual factors for all reflections included in the refinement: 0.049
• Goodness-of-fit parameter for all reflections included in the refinement: 1.123
• Diffraction radiation wavelength: 0.71075 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No