Information card for entry 7035452
| Formula |
C32 H32 O3 Si3 |
| Calculated formula |
C32 H32 O3 Si3 |
| SMILES |
[Si]12(O[Si](O[Si](O1)(C)C)(C)C)C(=C(C(=C2c1ccccc1)c1ccccc1)c1ccccc1)c1ccccc1 |
| Title of publication |
AEE-active cyclic tetraphenylsilole derivatives with σim 100% solid-state fluorescence quantum efficiency. |
| Authors of publication |
Cai, Yuanjing; Samedov, Kerim; Dolinar, Brian S.; Albright, Haley; Song, Zhegang; Zhang, Chaocan; Tang, Ben Zhong; West, Robert |
| Journal of publication |
Dalton transactions (Cambridge, England : 2003) |
| Year of publication |
2015 |
| Journal volume |
44 |
| Journal issue |
29 |
| Pages of publication |
12970 - 12975 |
| a |
11.36 ± 0.004 Å |
| b |
13.726 ± 0.005 Å |
| c |
19.888 ± 0.007 Å |
| α |
88.787 ± 0.014° |
| β |
86.1 ± 0.02° |
| γ |
79.312 ± 0.018° |
| Cell volume |
3040.1 ± 1.9 Å3 |
| Cell temperature |
100 K |
| Ambient diffraction temperature |
100 K |
| Number of distinct elements |
4 |
| Space group number |
2 |
| Hermann-Mauguin space group symbol |
P -1 |
| Hall space group symbol |
-P 1 |
| Residual factor for all reflections |
0.0564 |
| Residual factor for significantly intense reflections |
0.0399 |
| Weighted residual factors for significantly intense reflections |
0.0979 |
| Weighted residual factors for all reflections included in the refinement |
0.1062 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.046 |
| Diffraction radiation probe |
x-ray |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Diffraction radiation X-ray symbol |
K-L~3~ |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
No |
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https://www.crystallography.net/7035452.html
